Inicio Measuring Success: Testing, Grades, and the Future of College Admissions de Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor) (ISBN: 9781421424965)

Foto de archivo: la portada puede ser diferente

Measuring Success: Testing, Grades, and the Future of College Admissions Tapa dura - 2017

Name: Measuring Success: Testing, Grades, and the Future of College Admissions
Price: 8.51 USD
Availability: InStock
Author: Buckley, Jack, Letukas, Lynn, Wildavsky, Ben
ISBN: 9781421424965

de Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor)

Ver más ejemplares ↓

Detalles

Título Measuring Success: Testing, Grades, and the Future of College Admissions
Autor Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor)
Encuadernación Tapa dura
Páginas 344
Volúmenes 1
Idioma ENG
Editorial Johns Hopkins University Press
Fecha de publicación 2017-12
Features Bibliography, Index
ISBN 9781421424965 / 1421424967
Peso 1.19 libras (0.54 kg)
Dimensiones 8.9 x 6 x 1.2 pulgadas (22.61 x 15.24 x 3.05 cm)
Library of Congress subjects EDUCATION / Higher, EDUCATION / Testing & Measurement
Número de catálogo de la Librería del Congreso de EEUU 2017035199
Dewey Decimal Code 378.166

Acerca del autor

Jack Buckley is the senior vice president of research and evaluation at the American Institutes for Research and a research associate professor of applied statistics at New York University. He is the coauthor of Charter Schools: Hope or Hype? Lynn Letukas is an associate research scientist at the College Board. She is the author of Primetime Pundits: How Cable News Covers Social Issues. Ben Wildavsky is senior fellow and executive director at the College Board Policy Center. He is the author of The Great Brain Race: How Global Universities are Reshaping the World.

Ir arriba↑