Pattern classification and scene analysis

New York.: Wiley-Interscience., 1973.. Hardcover. Cubierta deslucida. Good. 24 cm. xix,482 p. : ill. Encuadernación en tapa dura de editorial. Idioma Inglés. Richard O. Duda, Peter E. Hart. A Wiley-Interscience publication. Title page imprint: London. Includes bibliographies and index. Contributor biographical information http://catdir. loc. gov/catdir/enhancements/fy0607/72007008-b. html. Contents pt. I. Pattern classification. Bayesian decision theory -- Parameter estimation and supervised learning -- Nonparametric techniques -- Linear discriminant functions -- Unsupervised learning and clustering -- pt. II. Scene analysis. Representation and initial simplifications -- The spatial frequency domain -- Descriptions of line and shape -- Perspective transformations -- Projective invariants -- Descriptive methods in scene analysis . Cubierta deslucida. ISBN: 9780471223610 Deutsche Arbeitsgemeinschaft fuÌ?r Mustererkennung Symposium, Pattern recognition systems., Statistical decision