Design-For-Test For Digital Ic's and Embedded Core Systems
de Alfred Crouch
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Design-For-Test For Digital IC's and Embedded Core Systems
de Crouch, Alfred
- Estado
- New
- Edición
- First Edition
- Published
- 1999
- Encuadernación
- Hardcover
- ISBN
- 9780130848277
- Cantidad disponible
- 1
- Librería
-
Hygiene, Colorado, USA
- Precio
-
EUR 156.67
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Descripción:
Upper Saddle River, N.J.: Prentice Hall, 1999. Comprehensive text introduces the basic concepts of test and design-for-test (DFT), and addresses the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the… Saber más sobre este artículo Precio
EUR 156.67
Design-For-Test for Digital Ic's & Embedded Core Systems
de Crouch, Alfred L
- Estado
- Used: Good
- Published
- 0000-00-00
- Encuadernación
- Hardcover
- ISBN
- 9780130848277
- Cantidad disponible
- 1
- Librería
-
HOUSTON, Texas, USA
- Precio
-
EUR 10.19
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Descripción:
Prentice Hall, 0000-00-00. hardcover. Used: Good. Precio
EUR 10.19
Design-For-Test for Digital Ic's & Embedded Core Systems
de Crouch, Alfred L
- Estado
- Used:Good
- Published
- 0000-00-00
- Encuadernación
- Hardcover
- ISBN
- 9780130848277
- Cantidad disponible
- 1
- Librería
-
HOUSTON, Texas, USA
- Precio
-
EUR 129.94
Mostrar detalles
Descripción:
Prentice Hall, 0000-00-00. hardcover. Used:Good. Precio
EUR 129.94
