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Electron Microdiffraction
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Electron Microdiffraction Tapa dura - 1992 - 1992nd Edición

de J. M. Zuo; J. C. Spence


Información de la editorial

Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O'Keeffe for his encouragement. The depth of his under- standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable sounding board for ideas, and was responsible for much of the experimental and theoretical work on coherent nanodiffraction. The sections on this topic derive mainly from collaborations by J. C. H. S. with him in the seventies.

Detalles

  • Título Electron Microdiffraction
  • Autor J. M. Zuo; J. C. Spence
  • Encuadernación Tapa dura
  • Número de edición 1992nd
  • Edición 1992
  • Páginas 358
  • Volúmenes 1
  • Idioma ENG
  • Editorial Springer
  • Fecha de publicación 1992-12-31
  • Ilustrado
  • ISBN 9780306442629 / 0306442620
  • Peso 1.63 libras (0.74 kg)
  • Dimensiones 9.74 x 6.26 x 1.03 pulgadas (24.74 x 15.90 x 2.62 cm)
  • Library of Congress subjects Thin films - Optical properties, Solid state physics
  • Número de catálogo de la Librería del Congreso de EEUU 92033963
  • Dewey Decimal Code 530.427
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Springer-Verlag Publishing, 1992. 1. Hardcover. Good. Good; Hardcover; Withdrawn library copy with the standard library markings; Moderate shelfwear and edgewear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; The binding is good with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); Green and black covers with title in black lettering; 1992, Springer-Verlag Publishing; 358 pages; "Electron Microdiffraction," by J.M. Zuo & J.C.H. Spence.
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Springer-Verlag Publishing, 1992. 1. Hardcover. Good. Good+; Hardcover; Moderate wear to the covers; Unblemished textblock edges; The endpapers and all text pages are clean and unmarked; The binding is excellent with a straight spine; This book will be stored and delivered in a sturdy cardboard box with foam padding; Medium Format (8.5” – 9.75” tall); Green and black covers with title in black lettering; 1992, Springer-Verlag Publishing; 358 pages; "Electron Microdiffraction," by J.M. Zuo & J.C.H. Spence.
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Electron Microdiffraction

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