Descripción:
UsedGood. There is either a name, note, or insciprtion on the inside cover. The pages are sun faded and slightly yellowing. We flipped through this book and didn't notice any notes or underlines. The cover has visible markings and wear. Some corner dings. The dust jacket shows normal wear and tear. The dust jacket has minor damage or small tear. This is a hardcover copy. Fast Shipping - Each order powers our free bookstore in Chicago and sending books to Africa!
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Semiconductor Material and Device Characterization Tapa dura - 1990
de Dieter K. Schroder
Detalles
- Título Semiconductor Material and Device Characterization
- Autor Dieter K. Schroder
- Encuadernación Tapa dura
- Edición First Edition; F
- Páginas 624
- Volúmenes 1
- Idioma ENG
- Editorial Wiley-Interscience, New York
- Fecha de publicación 1990
- ISBN 9780471511045 / 0471511048
- Peso 2.11 libras (0.96 kg)
- Dimensiones 9.53 x 6.47 x 1.18 pulgadas (24.21 x 16.43 x 3.00 cm)
- Library of Congress subjects Semiconductors, Semiconductors - Testing
- Número de catálogo de la Librería del Congreso de EEUU 89024881
- Dewey Decimal Code 621.381
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Semiconductor Material and Device Characterization
de Schroder, Dieter K.
- Usado
- Tapa dura
- Estado
- UsedGood
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
Skokie, Illinois, United States
- Precio
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EUR 8.69EUR 3.78 enviando a USA
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Semiconductor Material and Device Characterization
de Dieter K. Schroder
- Usado
- Bien
- Tapa dura
- Estado
- Usado - Bien
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
Seattle, Washington, United States
- Precio
-
EUR 12.48Envío gratuito a USA
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Descripción:
Wiley & Sons, Incorporated, John, 1990. Hardcover. Good. Disclaimer:A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. The dust jacket is missing. At ThriftBooks, our motto is: Read More, Spend Less.
Precio
EUR 12.48
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Semiconductor Material and Device Characterization
de Schroder, Dieter K
- Usado
- Estado
- Used - Good
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
Mishawaka, Indiana, United States
- Precio
-
EUR 12.57Envío gratuito a USA
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Descripción:
Wiley & Sons, Incorporated, John. Used - Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
Precio
EUR 12.57
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Semiconductor Material and Device Characterization
de Schroder, Dieter K.
- Usado
- Bueno
- Tapa dura
- Estado
- Usado - Bueno
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
Vancouver, Washington, United States
- Precio
-
EUR 44.50EUR 5.67 enviando a USA
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Descripción:
Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1990 hardback book and dust jacket in near fine condition. Hardcover. Near Fine/Near Fine.
Precio
EUR 44.50
EUR 5.67
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Semiconductor Material and Device Characterization
- Usado
- Bien
- Tapa dura
- Estado
- Usado - Bien
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
DFW, Texas, United States
- Precio
-
EUR 47.12EUR 5.67 enviando a USA
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Descripción:
good. hardcover. cover and corner wear. no dust jacket. note on title page. bent cover corners. name on book edge.
Precio
EUR 47.12
EUR 5.67
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Semiconductor Material and Device Characterization
de Schroder, Dieter K.
- Usado
- Bien
- Tapa dura
- Estado
- Usado - Bien
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
Newport Coast, California, United States
- Precio
-
EUR 54.70Envío gratuito a USA
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Descripción:
hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Precio
EUR 54.70
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![Semiconductor Material and Device Characterization - 1st Edition/1st Printing](https://d3525k1ryd2155.cloudfront.net/h/580/786/502786580.0.m.jpg)
Semiconductor Material and Device Characterization - 1st Edition/1st Printing
de Schroder, Dieter K.
- Usado
- Tapa dura
- First
- Estado
- Usado - Near Fine in Near Fine dust jacket
- Edición
- First Edition; First Printing
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
Summerville, South Carolina, United States
- Precio
-
EUR 75.74EUR 6.63 enviando a USA
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Descripción:
New York: John Wiley & Sons, Inc.. Near Fine in Near Fine dust jacket. 1990. First Edition; First Printing. Hardcover. 0471511048 . A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo .
Precio
EUR 75.74
EUR 6.63
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Semiconductor Material and Device Characterization
de Schroder, Dieter K
- Nuevo
- Tapa dura
- Estado
- Nuevo
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780471511045 / 0471511048
- Cantidad disponible
- 1
- Librería
-
San Diego, California, United States
- Precio
-
EUR 81.85EUR 5.16 enviando a USA
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Descripción:
Wiley-Interscience, 1990-07-04. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
Precio
EUR 81.85
EUR 5.16
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