Failure Mechanisms in Semiconductor Devices Tapa dura - 1997
de E. Ajith Amerasekera; Farid N. Najm
Descripción de contraportada
Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.
Detalles
- Título Failure Mechanisms in Semiconductor Devices
- Autor E. Ajith Amerasekera; Farid N. Najm
- Encuadernación Tapa dura
- Edición Second Edition
- Páginas 360
- Volúmenes 1
- Idioma ENG
- Editorial Wiley, Chichester, England
- Fecha de publicación 1997-08-04
- ISBN 9780471954828 / 0471954829
- Peso 1.36 libras (0.62 kg)
- Dimensiones 9.3 x 6.53 x 1.03 pulgadas (23.62 x 16.59 x 2.62 cm)
- Library of Congress subjects Semiconductors - Failures
- Número de catálogo de la Librería del Congreso de EEUU 96049978
- Dewey Decimal Code 621.381
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Failure Mechanisms in Semiconductor Devices
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