Descripción:
Bellingham, WA: SPIE Optical Engineering Press, 1995. Hardcover, [xiii], 321 pages. Near Fine condition. Second edition. Size 10.25"x7.25". "As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has very light exterior shelfwear, else As New, clean and unmarked.. Near Fine.
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Optical Scattering: Measurement and Analysis Tapa dura - 1995
de John C. Stover
Detalles
- Título Optical Scattering: Measurement and Analysis
- Autor John C. Stover
- Encuadernación Tapa dura
- Edición Second
- Páginas 340
- Volúmenes 1
- Idioma ENG
- Editorial SPIE-International Society for Optical Engine
- Fecha de publicación 1995-07
- ISBN 9780819419347 / 0819419346
- Peso 1.78 libras (0.81 kg)
- Dimensiones 10.31 x 7.34 x 0.94 pulgadas (26.19 x 18.64 x 2.39 cm)
- Número de catálogo de la Librería del Congreso de EEUU 95014620
- Dewey Decimal Code 535.4
Más ejemplares
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Optical Scattering: Measurement and Analysis (Second Edition)
de Stover, John C.
- Usado
- near fine
- Tapa dura
- Estado
- Usado - Near Fine
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
- Cantidad disponible
- 1
- Librería
-
Datil, New Mexico, United States
- Precio
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EUR 23.52EUR 4.67 enviando a USA
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Precio
EUR 23.52
EUR 4.67
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Optical Scattering Vol. 24 : Measurement and Analysis
de John C. Stover
- Usado
- very good
- Tapa dura
- Estado
- Usado - Very Good
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
- Cantidad disponible
- 2
- Librería
-
Seattle, Washington, United States
- Precio
-
EUR 30.33Envío gratuito a USA
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Descripción:
SPIE, 1995. Hardcover. Very Good. Disclaimer:May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
Precio
EUR 30.33
Envío gratuito a USA
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Optical Scattering: Measurement and Analysis
de Stover, John C.
- Usado
- Tapa dura
- Estado
- Usado - Good+
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
- Cantidad disponible
- 1
- Librería
-
Datil, New Mexico, United States
- Precio
-
EUR 33.93EUR 4.67 enviando a USA
Mostrar detalles
Descripción:
Bellingham, WA: SPIE Optical Engineering Press, 1995. Hardcover, [xiii], 321 pages. Good+ condition. Second edition. Size 10.25"x7.25". "Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has moderate exterior shelfwear, and a small surface tear on the front board cover. Previous owner's name on front fly, text else clean and unmarked.. Good+.
Precio
EUR 33.93
EUR 4.67
enviando a USA
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Optical Scattering: Measurement and Analysis (SPIE Press Monograph Vol. PM24) (Press Monographs)
de John C. Stover
- Usado
- good
- Tapa dura
- Estado
- Usado - Good
- Encuadernación
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
- Cantidad disponible
- 1
- Librería
-
HOUSTON, Texas, United States
- Precio
-
EUR 39.45Envío gratuito a USA
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Descripción:
SPIE Publications, 1995-07-01. Hardcover. Good.
Precio
EUR 39.45
Envío gratuito a USA