Inicio Design and Test Technology for Dependable Systems-on-Chip de Raimund Ubar (Editor); Jaan Raik (Editor); Heinrich Theodor Vierhaus (Editor) (ISBN: 9781609602123)

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Design and Test Technology for Dependable Systems-on-Chip Tapa dura - 2011 - 1st Edición

Name: Design and Test Technology for Dependable Systems-on-Chip
Price: 199.33 GBP
Availability: InStock
Author: Raimund Ubar
ISBN: 9781609602123

de Raimund Ubar (Editor); Jaan Raik (Editor); Heinrich Theodor Vierhaus (Editor)

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Información de la editorial

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Detalles

Título Design and Test Technology for Dependable Systems-on-Chip
Autor Raimund Ubar (Editor); Jaan Raik (Editor); Heinrich Theodor Vierhaus (Editor)
Encuadernación Tapa dura
Número de edición 1st
Edición 1
Páginas 580
Volúmenes 1
Idioma ENG
Editorial Information Science Reference
Fecha de publicación 2011-03-31
Features Bibliography, Index, Table of Contents
ISBN 9781609602123 / 1609602129
Peso 3.55 libras (1.61 kg)
Dimensiones 11.2 x 8.6 x 1.4 pulgadas (28.45 x 21.84 x 3.56 cm)
Temas
- Aspects (Academic): Science/Technology Aspects
Número de catálogo de la Librería del Congreso de EEUU 2010045850
Dewey Decimal Code 621.381