Citation-Based Plagiarism Detection: Detecting Disguised and Cross-Language Plagiarism Using Citation Pattern Analysis Tapa blanda - 2014
de Bela Gipp
Descripción de contraportada
Plagiarism is a problem with far-reaching consequences for the sciences. However, even today's best software-based systems can only reliably identify copy&paste plagiarism. Disguised plagiarism forms, including paraphrased text, cross-language plagiarism, as well as structural and idea plagiarism often remain undetected. This weakness of current systems results in a large percentage of scientific plagiarism going undetected. Bela Gipp provides an overview of the state-of-the art in plagiarism detection and an analysis of why these approaches fail to detect disguised plagiarism forms. The author proposes Citation-based Plagiarism Detection to address this shortcoming. Unlike character-based approaches, this approach does not rely on text comparisons alone, but analyzes citation patterns within documents to form a language-independent "semantic fingerprint" for similarity assessment. The practicability of Citation-based Plagiarism Detection was proven by its capability to identify so-far non-machine detectable plagiarism in scientific publications.
Contents
- Current state of plagiarism detection approaches and systems
- Citation-based Plagiarism Detection
Target Groups
- Readers interested in the problem of plagiarism in the sciences
- Faculty and students from all disciplines, but especially computer science
The Author
Bela Gipp is a postdoctoral researcher at the University of California, Berkeley.
Detalles
- Título Citation-Based Plagiarism Detection: Detecting Disguised and Cross-Language Plagiarism Using Citation Pattern Analysis
- Autor Bela Gipp
- Encuadernación Tapa blanda
- Páginas 350
- Volúmenes 1
- Idioma ENG
- Editorial Springer Vieweg
- Fecha de publicación 2014-07-14
- Ilustrado Sí
- Features Illustrated
- ISBN 9783658063931 / 3658063939
- Peso 1.09 libras (0.49 kg)
- Dimensiones 8.27 x 5.83 x 0.84 pulgadas (21.01 x 14.81 x 2.13 cm)
-
Temas
- Aspects (Academic): Science/Technology Aspects
- Dewey Decimal Code 005.7
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Citation-based Plagiarism Detection : Detecting Disguised and Cross-language Plagiarism using Citation Pattern Analysis
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Citation-based Plagiarism Detection: Detecting Disguised and Cross-language Plagiarism Using Citation Pattern Analysis
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Citation-based Plagiarism Detection: Detecting Disguised and Cross-language Plagiarism using Citation Pattern Analysis
de Bela Gipp
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Citation-based Plagiarism Detection: Detecting Disguised and Cross-language Plagiarism using Citation Pattern Analysis
de Gipp, Bela
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