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Frontiers Of Characterization And Metrology For Nanoelectronics
de Editor-David G. Seiler; Editor-Alain C. Diebold; Editor-Robert McDonald; Editor-C. Michael Garner; Editor-Dan Herr; Editor-Rajinder P. Khosla; Editor-Erik M. Secula
- Usado
- Tapa dura
- Estado
- Fine, sealed CD, two small bumps bottom of front cover, text unmarked
- ISBN 10
- 0735404410
- ISBN 13
- 9780735404410
- Librería
-
Baltimore, Maryland, United States
Formas de pago aceptadas
Sobre este artículo
Large hardback with 578 pages and sealed CD. FINE
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Detalles
- Librería
- Arbutus Books
(US)
- Inventario del vendedor #
- 873
- Título
- Frontiers Of Characterization And Metrology For Nanoelectronics
- Autor
- Editor-David G. Seiler; Editor-Alain C. Diebold; Editor-Robert McDonald; Editor-C. Michael Garner; Editor-Dan Herr; Editor-Rajinder P. Khosla; Editor-Erik M. Secula
- Estado del libro
- Usado - Fine, sealed CD, two small bumps bottom of front cover, text unmarked
- Cantidad disponible
- 1
- Encuadernación
- Tapa dura
- ISBN 10
- 0735404410
- ISBN 13
- 9780735404410
- Editorial
- American Institute of Physics
- Fecha de publicación
- 2007
Términos de venta
Arbutus Books
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Sobre el vendedor
Arbutus Books
Miembro de Biblio desde 2013
Baltimore, Maryland
Sobre Arbutus Books
Retired person selling from home. Selling a small number of books in the $50 - $200 range for a local charity
Glosario
Algunos términos que podrían usarse en esta descripción incluyen:
- Fine
- A book in fine condition exhibits no flaws. A fine condition book closely approaches As New condition, but may lack the...
