Automatic Testing Conference
de Ieee
Ejemplares disponibles
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '98), PROCEEDINGS OF IEEE INTERNATIONAL, 25-27 August 1998, Salt Lake City, Utah.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1998
- Encuadernación
- Hardcover
- ISBN
- 9780780344211
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 39.70
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1998. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 98CH36179. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 39.70
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '88), PROCEEDINGS OF IEEE INTERNATIONAL, 4-6 October 1988, Minneapolis, Minnesota.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1988
- Encuadernación
- Hardcover
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 28.36
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1988. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 88CH25759. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 28.36
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '91), PROCEEDINGS OF IEEE INTERNATIONAL, 24-26 September 1991, Anaheim, California.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1991
- Encuadernación
- Hardcover
- ISBN
- 9780879425777
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 34.03
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1991. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 91CH29413. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound Ex-Library Size: 4to. Precio
EUR 34.03
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '96), PROCEEDINGS OF IEEE INTERNATIONAL, 16-19 September 1996, Dayton, Ohio.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1996
- Encuadernación
- Hardcover
- ISBN
- 9780780333802
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 34.03
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1996. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 96CH35955. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 34.03
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25 September 1997, Anaheim, California.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1997
- Encuadernación
- Hardcover
- ISBN
- 9780780341630
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 38.75
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1997. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 97CH36120. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 38.75
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1995
- Encuadernación
- Hardcover
- ISBN
- 9780780326224
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 39.70
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1995. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 95CH35786. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 39.70
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '93), PROCEEDINGS OF IEEE INTERNATIONAL, 20-23 September 1993, San Antonio, Texas.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1993
- Encuadernación
- Hardcover
- ISBN
- 9780780306479
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 45.37
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1993. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 93CH31492. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 45.37
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '92), PROCEEDINGS OF IEEE INTERNATIONAL, 21-24 September 1992, Dayton, Ohio.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1992
- Encuadernación
- Hardcover
- ISBN
- 9780780306448
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 34.03
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1992. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 34.03
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '90), PROCEEDINGS OF IEEE INTERNATIONAL, 17-20 September 1990, San Antonio, Texas.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1990
- Encuadernación
- Hardcover
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 25.52
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1990. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 90CH27938. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 25.52
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '89), PROCEEDINGS OF IEEE INTERNATIONAL, 25-28 September 1989, Philadelphia, Pennsylvania.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1989
- Encuadernación
- Hardcover
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 28.36
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1989. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 88CH25684. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 28.36
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '87), PROCEEDINGS OF IEEE INTERNATIONAL, 3-5 November 1987, San Francisco, California.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1987
- Encuadernación
- Hardcover
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 34.03
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1987. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 87CH25106. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 34.03
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '94), PROCEEDINGS OF IEEE INTERNATIONAL, 20-22 September 1994, Anaheim, California.
de IEEE
- Estado
- Usado - Very Good
- Estado de la sobrecubierta
- No Jacket
- Edición
- 1st Edition.
- Published
- 1994
- Encuadernación
- Hardcover
- Cantidad disponible
- 1
- Librería
-
NEWARK, Ohio, USA
- Precio
-
EUR 45.37
Mostrar detalles
Descripción:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1994. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 94CH34363. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to. Precio
EUR 45.37
